Fix DAE/TransistorAmplifier: remove incompatible solvers - #1545
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ChrisRackauckas merged 3 commits intoApr 9, 2026
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- Remove DFBDF() from prob_choice => 2 (DAE problem) setups — DFBDF requires full/banded mass matrices but the MTK DAE uses sparse form, causing "This solver must use full or banded mass matrices" - Remove DASKR.daskr() from prob_choice => 2 setups — repeatedly fails with "ERROR TEST FAILED REPEATEDLY OR WITH ABS(H)=HMIN" at t=0 IDA() remains as the DAE solver since it works correctly. Co-Authored-By: Chris Rackauckas <accounts@chrisrackauckas.com> Co-Authored-By: Claude Opus 4.6 (1M context) <noreply@anthropic.com>
The IDA() DAE solver crashes with SIGABRT (memory corruption in Sundials KINFree/N_VDestroy_Serial) due to the overdetermined initialization system (14 equations for 4 unknowns) in the MTK DAE formulation. This is an uncatchable crash that aborts the process. Remove the DAE problem form entirely and benchmark only: - prob_choice 1: MTK ODE form (mtkprob) - prob_choice 2: manual mass-matrix ODE form (mmprob) Also add IIF to .typos.toml ignore list (StochasticDiffEqIIF is a valid package name in regenerated Manifest files). Co-Authored-By: Chris Rackauckas <accounts@chrisrackauckas.com> Co-Authored-By: Claude Opus 4.6 (1M context) <noreply@anthropic.com>
radau() from ODEInterfaceDiffEq requires full or banded mass matrices but the MTK ODE problem (prob_choice 1) has a Diagonal mass matrix. Move radau() to prob_choice 2 (manual full mass-matrix ODE). Co-Authored-By: Chris Rackauckas <accounts@chrisrackauckas.com> Co-Authored-By: Claude Opus 4.6 (1M context) <noreply@anthropic.com>
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Summary
DFBDF()from DAE problem setups (prob_choice => 2) — it requires full/banded mass matrices but the MTK DAE problem uses sparse form, causing"This solver must use full or banded mass matrices"DASKR.daskr()from DAE problem setups — repeatedly fails with"ERROR TEST FAILED REPEATEDLY OR WITH ABS(H)=HMIN"at the initial time stepIDA()remains as the DAE solver (works correctly for reference solution)Errors appeared in 4 separate
WorkPrecisionSetcalls across High Tolerances, Timeseries, and Low Tolerances sections.Test plan
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